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uses electrons to create detailed surface images of samples

Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses a focused beam of electrons to create highly detailed, three-dimensional images of a sample's surface. Unlike traditional light microscopes, SEM can achieve much higher magnifications and resolutions, making it invaluable for examining the fine details of biological specimens, materials, and nanostructures.

Related Terms

• Electron Microscopy
• Transmission Electron Microscopy
• Scanning Tunneling Microscopy
• Scanning Probe Microscopy
• Electrospray Ionization Mass Spectrometry
• Atomic Force Microscopy
• Confocal Microscopy
• Electron Paramagnetic Resonance Spectroscopy